Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002
... Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002 ... Tc . 400 아 Tetragonal 300 Rhombohedral ( high - temperature 200 form ) 100 ... Tc varies from 230 ° C to 490 ° C depending 17.
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002
... Part I – Fundamentals of Functional Materials ix xiii xv xvi xvii xxi xxv FUNCTIONAL MATERIALS: PROPERTIES, PROCESSING AND APPLICATIONS P.M. Vilarinho 3 SCALING OF SILICON-BASED DEVICES TO SUBMICRON DIMENSIONS A.I. Kingon 35 UNSOLVED ...
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